Materials Lab XM

Highlights​​

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• Impedance range from 1 mOhm to 1 TOhm (1E15 Range)

• Small footprint and application-focus design

• Auxiliary measurement port for synchronized measurement of optical, mechanical or other transducers.

• Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections

• Low frequency to 10 µHz for degradation, trap state and material purity studies

• XM-Studio software is included with all XM Series systems

• Materials Lab XM impedance accuracy contour plot highlights Solartron's best in class measurement performance.

Applications and Software​

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The Materials Lab XM can perform time domain (DC) and frequency domain (AC) tests.  Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials.  ModuLab XM platform systems can be expanded for electrochemical or photoelectrochemical experiments.

Materials Lab XM’s impedance accuracy contour plot highlights Solartron’s best in class measurement performance.

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Dielectric Materials

Ferro/piezoelectrics | MEMs | NEMs| multiferroics | Polymers | Solid oxides SOFC | ionic conductors | Solid electrolytes, quantum dots

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Electronic Materials
LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials 

Specifications​

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• Maximum Frequency: 1 MHz

• Combines with DC for Electrochemical Measurements: No

• Highest Impedance: 1 TOhms

• Low Impedance: 1 mOhms

• Software: XM Studio