SolarLab XM Photoelectrochemical Test System

Highlights​​

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• Developed in conjunction with Professor Laurie Peter

• Frequency and time domain techniques including IMPS, IMVS, Impedance, Photovoltage Decay, Charge Extraction, I-V

• Auto analysis for calculating effective diffusion coefficients and electron lifetimes

• NIST traceable light source calibration

• Excellent thermal management of light sources for long term stability

• Full set of electrochemical techniques (cyclic voltammetry, chrono methods, galvano methods, impedance and AC voltammetry)

• IPCE option for quantum efficiency measurements

• Expandable platform for Electrochemistry and Materials testing

• ModuLab XM PhotoEchem impedance accuracy contour plot highlights Solartron's best in class measurement performance.

Applications and Software​

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• IMPS: Effective Diffusion Coefficient of Electrons

• IMVS: Effective Lifetime of Electrons

• Photo Voltage Decay: Effective Lifetime of Electrons

• I-V: Fill Factor, Pmax, Voc, Isc, Efficiency

• Charge extraction - Dark: Trapped Charge Density

• Charge extraction - Short Circuit: Trapped Charge Density

• IPCE option: Quantum Efficiency 

• AC Measurement: Impedance / Capacitance

Specifications​

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• Wavelength Range: 350 nm - 1100 nm

• Intensity Range: 6 Decades (with ND Filter)

• Maximum Beam Divergence: 4 degrees

• Maximum Beam Diameter / Cell Size: 1 cm

• IMPS / IMVS Transfer Function: Reference Photodetector

• Calibration: NIST Traceable

• LED Driver Maximum Current: 10 A

• Typical LED Stability at Max Power: < 2% Drift after 24 hours

• LED Driver Maximum Frequency (IMPS and IMVS): 250 kHz

• Expandable to materials Testing Low-current Measurements (Femto Amp): No