ModuLab XM MTS

Highlights​​

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• Widest impedance range - µohms to >100 Tohms

• Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections

• Low frequency to 10 µHz for degradation, trap state and material purity studies

• Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators)

• XM-Studio software is included with all XM Series systems

• ModuLab XM MTS impedance accuracy contour plot highlights Solartron's best in class measurement performance.

Applications and Software​

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The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests.  Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials.  As with other ModuLab platform systems it can be expanded for electrochemical or photoelectrochemical experiments.

ModuLab MTS XM’s impedance accuracy contour plot highlights Solartron’s best in class measurement performance.

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Dielectric Materials

Ferro/piezoelectrics | MEMs | NEMs| multiferroics | Polymers | Solid oxides SOFC | ionic conductors | Solid electrolytes, quantum dots

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Electronic Materials
LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials 

Specifications​

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• Maximum Frequency: 1 MHz

• Combines with DC for Electrochemical Measurements: Yes, with XM PSTAT 1 MS/s

• Highest Impedance: 100 TOhms

• Low Impedance: 10 µOhms

• Software: XM Studio